X-Rite

New illuminant design allows for 3 standard measurement conditions (ISO 13655 M0: Tungsten; ISO 13655 M1: D50; ISO 13655 M2: UV Cut) plus Optical Brightener Compensation (OBC) without changing filters or needing a second instrument
Enhanced Optical Brightener Compensation allows for the most accurate profiling for today’s enhanced range of substrates. See what colors printed on optically brightened paper will look like under standard and specific light conditions using one device.
Positioning Detection Sensor provides a more robust scanning experience even on special substrates and low-resolution printers. It allows for measurement of smaller patch sizes in manual mode saving on consumables and enabling dual measurement workflows.